News
- 2019-05-24 ISO/TS 19807-2 "Nanotechnologies -- Magnetic nanomaterials -- Part 2: Specification of characteristics and measurements for nanostructured superparamagnetic beads for nucleic acid extraction"
- 2018-09-07 Cooperation, the key to the future
- 2016-11-15 Sino-German City-to-City Standardization Cooperation Seminar
Links
- BAM - Federal Institute for Materials Research and Testing
- DIN Media - DIN Media GmbH
- BMWK - Federal Ministry for Economic Affairs and Climate Action
- DIN - Deutsches Institut für Normung
- PTB - Physikalisch-Technische Bundesanstalt
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DIN EN IEC 63356-1
LED light source characteristics - Part 1: Data sheets (IEC 63356-1:2023); German version EN IEC 63356-1:2023
DIN EN IEC 63355
Cable management systems - Test method for content of halogens (IEC 63355:2022); German version EN IEC 63355:2022
DIN EN IEC 63345
Energy efficiency systems - Simple external consumer display (IEC 63345:2023); German version EN IEC 63345:2023
DIN EN IEC 63300
Test methods for electrical and magnetic properties of magnetic powder cores (IEC 63300:2023); German version EN IEC 63300:2023
DIN EN IEC 63299
Klassifizierung magnetischer Pulverkerne (IEC 63299:2022); Deutsche Fassung EN IEC 63299:2022
Classification of magnetic powder cores (IEC 63299:2022); German version EN IEC 63299:2022
DIN EN IEC 63278-1
Asset Administration Shell for industrial applications - Part 1: Asset Administration Shell structure (IEC 63278-1:2023); German version EN IEC 63278-1:2024
DIN EN IEC 63296-2
Portable multimedia equipment - Determination of battery duration - Part 2: Headphones and earphones with active noise-cancelling functions (IEC 63296-2:2023); German version EN IEC 63296-2:2024
DIN EN IEC 63296-1
Portable multimedia equipment - Determination of battery duration - Part 1: Powered loudspeaker equipment (IEC 63296-1:2021); German version EN IEC 63296-1:2021
DIN EN IEC 63295
Specification for WB series glass beads with 50 <OMEGA> impedance for RF connectors (IEC 63295:2022); German version EN IEC 63295:2022
DIN EN IEC 63287-2
Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile (IEC 63287-2:2023); German version EN IEC 63287-2:2023