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Number of entries (Data is updated on a monthly basis): 81989
Weiter Weiter| 41761 - 41770 | 41771 - 41780|41781 - 41790 |Weiter Weiter

GB/T 35002-2018

微波电路 频率源测试方法

Microwave circuits—Measuring methods for frequency source

GB/T 35001-2018

微波电路 噪声源测试方法

Microwave circuits—Measuring methoels for noise source

GB/T 35005-2018

集成电路倒装焊试验方法

Test methods for flip chip integrated circuits

GB/T 35010.7-2018

半导体芯片产品 第7部分:数据交换的XML格式

Semiconductor die products—Part 7: XML schema for data exchange

GB/T 35011-2018

微波电路 压控振荡器测试方法

Microwave circuits—Measuring methods for voltage controlled oscillater

GB/T 35010.1-2018

半导体芯片产品 第1部分:采购和使用要求

Semiconductor die products—Part 1:Requirements for procurement and use

GB/T 14028-2018

半导体集成电路 模拟开关测试方法

Semiconductor integrated circuits—Measuring method of analogue switch

GB/T 35009-2018

串行NAND型快闪存储器接口规范

Specification for serial NAND flash interface

GB/T 36037-2018

埋弧焊和电渣焊用焊剂

Fluxes for submerged arc welding and electroslag welding

GB/T 19532-2018

包装材料 气相防锈塑料薄膜

Packaging material—Volatile corrosion inhibiting film

Number of entries (Data is updated on a monthly basis): 81989
Weiter Weiter| 41761 - 41770 | 41771 - 41780|41781 - 41790 |Weiter Weiter