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- 2019-05-24 ISO/TS 19807-2 "Nanotechnologies -- Magnetic nanomaterials -- Part 2: Specification of characteristics and measurements for nanostructured superparamagnetic beads for nucleic acid extraction"
- 2018-09-07 Cooperation, the key to the future
- 2016-11-15 Sino-German City-to-City Standardization Cooperation Seminar
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- BAM - Federal Institute for Materials Research and Testing
- DIN Media - DIN Media GmbH
- BMWK - Federal Ministry for Economic Affairs and Climate Action
- DIN - Deutsches Institut für Normung
- PTB - Physikalisch-Technische Bundesanstalt
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DIN EN 62496-4
Optical circuit boards - Part 4: Interface standards - General and guidance (IEC 62496-4:2011); German version EN 62496-4:2011
DIN EN 62496-3-1
Optical circuit boards - Performance standard - Part 3-1: Flexible optical circuit boards using unconnectorized optical glass fibres (IEC 62496-3-1:2009); German version EN 62496-3-1:2010
DIN EN 62496-3
Optical circuit boards - Part 3: Performance standards - General and guidance (IEC 62496-3:2011); German version EN 62496-3:2011
DIN EN 62496-2
Optical circuit boards - Basic test and measurement procedures - Part 2: General guidance for definition of measurement conditions for optical characteristics of optical circuit boards (IEC 62496-2:2017); German version EN 62496-2:2017
DIN EN 62496-2-1
Optical circuit boards - Part 2-1: Measurements - Optical attenuation and isolation (IEC 62496-2-1:2011); German version EN 62496-2-1:2011
DIN EN 62496-2-4
Optical circuit boards - Basic test and measurement procedures - Part 2-4: Optical transmission test for optical circuit boards without input/output fibres (IEC 62496-2-4:2013); German version EN 62496-2-4:2013
DIN EN 62496-1
Optical circuit boards - Part 1: General (IEC 62496-1:2008); German version EN 62496-1:2009
DIN EN 62496-2-2
Optical circuit boards - Part 2-2: Measurements - Dimensions of optical circuit boards (IEC 62496-2-2:2011); German version EN 62496-2-2:2011
DIN EN 62494-1
Medical electrical equipment - Exposure index of digital X-ray imaging systems - Part 1: Definitions and requirements for general radiography (IEC 62494-1:2008); German version EN 62494-1:2008
DIN EN 62490-2
ESL measuring method - Part 2: Surface mount capacitors for use in electronic equipment (IEC 62490-2:2010); German version EN 62490-2:2010





