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Number of entries (Data is updated on a monthly basis): 47268
Weiter Weiter| 6461 - 6470 | 6471 - 6480|6481 - 6490 |Weiter Weiter

GB/Z 42625-2023

真空技术 真空计 用于分压力测量的四极质谱仪特性

Vacuum technology—Vacuum gauges—Characterization of quadrupole mass spectrometers for partial pressure measurement

GB/Z 42624-2023

真空技术 真空计 放气率的测试和报告程序

Vacuum technology—Vacuum gauges—Procedures to measure and report outgassing rates

GB/T 42621-2023

增材制造 定向能量沉积-铣削复合增材制造工艺规范

Additive manufacturing—Specification for hybrid additive manufacturing with directed energy deposition and milling process

GB/T 4937.42-2023

半导体器件 机械和气候试验方法 第42部分:温湿度贮存

Semiconductor devices—Mechanical and climatic test methods—Part 42:Temperature and humidity storage

GB/T 42741-2023

固体材料使用自由空间法的电磁参数测量方法

Measuring method for electromagnetic parameters of solid materials using air-freespace

GB/T 30544.7-2023

纳米科技 术语 第7部分:纳米医学诊断和治疗

Nanotechnologies—Vocabulary—Part 7: Diagnostics and therapeutics for healthcare

GB/T 4937.32-2023

半导体器件 机械和气候试验方法 第32部分:塑封器件的易燃性(外部引起的)

Semiconductor devices—Mechanical and climatic test methods—Part 32:Flammability of platic-encapsulated devices(externally induced)

GB/T 4937.31-2023

半导体器件 机械和气候试验方法 第31部分:塑封器件的易燃性(内部引起的)

Semiconductor devices—Mechanical and climatic test methods—Part 31:Flammability of platic-encapsulated devices(internally induced)

GB/T 4937.23-2023

半导体器件 机械和气候试验方法 第23部分:高温工作寿命

Semiconductor devices—Mechanical and climatic test methods—Part 23:High temperature operating life

GB/T 43892-2024

石英玻璃光谱透射比试验方法

Test method for spectral transmittance of quartz glass

Number of entries (Data is updated on a monthly basis): 47268
Weiter Weiter| 6461 - 6470 | 6471 - 6480|6481 - 6490 |Weiter Weiter