News
- 2019-05-24 ISO/TS 19807-2 "Nanotechnologies -- Magnetic nanomaterials -- Part 2: Specification of characteristics and measurements for nanostructured superparamagnetic beads for nucleic acid extraction"
- 2018-09-07 Cooperation, the key to the future
- 2016-11-15 Sino-German City-to-City Standardization Cooperation Seminar
Links
- BAM - Federal Institute for Materials Research and Testing
- DIN Media - DIN Media GmbH
- BMWK - Federal Ministry for Economic Affairs and Climate Action
- DIN - Deutsches Institut für Normung
- PTB - Physikalisch-Technische Bundesanstalt
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GB/T 21427-2025
Special environmental condition—Technical requirements and test methods for electric power plant system with internal combustion engines in dry heat-desert
GB/T 21561.1-2025
轨道交通 机车车辆 受电弓特性和试验 第1部分:机车车辆受电弓
Railway applications—Rolling stock—Pantographs characteristics and tests—Part 1:Pantographs for vehicles
GB/T 20047.1-2025
Photovoltaic (PV) module safety qualification—Part 1:Requirements for construction
GB/T 4937.40-2025
半导体器件 机械和气候试验方法 第40部分:采用应变仪的板级跌落试验方法
Semiconductor devices—Mechanical and climatic test methods—Part 40: Board level drop test method using a strain gauge
GB/T 29484.506-2025
船舶电气设备 第506部分:专辑 运载特定危险货物和散装危险物质的船舶
Electrical installations in ships—Part 506: Special features—Ships carrying specific dangerous goods and materials hazardous only in bulk
GB/T 20521.4-2025
Semiconductor devices—Part 14-4:Semiconductor sensors—Semiconductor accelerometers
GB/T 22200.4-2025
低压电器可靠性 第4部分:家用及类似场所用过电流保护断路器的可靠性试验方法
Reliability of low-voltage apparatus—Part 4:Reliability test method of circuit-breakers for overcurrent protection for household and similar installation
GB/T 4937.37-2025
半导体器件 机械和气候试验方法 第37部分:采用加速度计的板级跌落试验方法
Semiconductor devices—Mechanical and climatic test methods—Part 37: Board level drop test method using an accelerometer
GB/T 22200.5-2025
低压电器可靠性 第5部分:家用和类似用途的剩余电流动作断路器可靠性试验方法
Reliability of low-voltage apparatus—Part 5:Reliability test method of residual current operated circuit-breaker for household and similar uses
GB/T 22200.7-2025
Reliability for low-voltage apparatus—Part 7: Reliability test method of contactors