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- 2019-05-24 ISO/TS 19807-2 "Nanotechnologies -- Magnetic nanomaterials -- Part 2: Specification of characteristics and measurements for nanostructured superparamagnetic beads for nucleic acid extraction"
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DIN 50989-2
Ellipsometrie - Teil 2: Modell Volumenmaterial; Text Deutsch und Englisch
Ellipsometry - Part 2: Bulk material model; Text in German and English
DIN 50989-3
Ellipsometrie - Teil 3: Modell transparente Einfachschicht; Text Deutsch und Englisch
Ellipsometry - Part 3: Transparent single layer model; Text in German and English
DIN 50989-4
Ellipsometrie - Teil 4: Modell Semi-transparente Einfachschicht; Text Deutsch und Englisch
Ellipsometry - Part 4: Semi-transparent single layer model; Text in German and English
DIN 50989-5
Ellipsometry - Part 5: Multiple layers and periodic layers model; Text in German and English
DIN 50989-6
Ellipsometrie - Teil 6: Modell Effektive Materialien; Text Deutsch und Englisch
Ellipsometry - Part 6: Effective Materials model; Text in German and English
DIN 50990
Measurement of coating thickness - Measurement of the area-related mass of metallic layers by means of spectrometric measurement methods
DIN 50994
Messung von Schichten - Zerstörungsfreie Leitfähigkeitsmessung metallischer Schichten
Measurement of coatings - Non-destructive measurement of the conductivity of metallic coatings
DIN 50996
Nichtleitende Schichten - Zerstörungsfreie Messung der Schichtdicke - Terahertz-Messverfahren
Non-conductive coatings - Non-destructive measurement of coating thickness - Terahertz measurement method
DIN 50997
Zinc-aluminium coatings applied by thin film galvanizing of steel - Requirements and testing
DIN 51001
Testing of oxidic raw materials and basic materials - General bases of work for X-ray fluorescence method (XRF)